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Kuijk Bandgap Voltage Reference With High Immunity to EMI

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2 Author(s)
Redoute, J.-M. ; Dept. of Electr. Eng. (ESAT), Katholieke Univ. Leuven, Leuven, Belgium ; Steyaert, M.

This brief evaluates the effect of conducted electromagnetic interference (EMI) that is injected in the power supply of a classic Kuijk bandgap reference voltage circuit. Two modified Kuijk bandgap topologies with high immunity to EMI are introduced and compared to the original structure. Measurements of a test IC confirm the theoretical analyses.

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Circuits and Systems II: Express Briefs, IEEE Transactions on  (Volume:57 ,  Issue: 2 )