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Browse Journals & Magazines > Magnetics, IEEE Transactions ...> Volume:32 Issue:5 Help

Quantitative magnetometry using electron holography: field profiles near magnetic force microscope tips

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4 Author(s)
Streblechenko, D.G. ; Dept. of Phys., Arizona State Univ., Tempe, AZ, USA ; Scheinfein, M.R. ; Mankos, Marian ; Babcock, Ken

Magnetic force microscopy offers an inexpensive means of measuring magnetic microstructure with high spatial resolution by scanning a magnetized tip across the surface of a magnetic sample. Contrast in the magnetic force microscope is a complicated function of the magnetic fields emanating both from the tip and the sample under observation. Electron holographic methods were used in order to quantitatively determine the fields in proximity to extremely small magnetic force microscope tips

Published in:
Magnetics, IEEE Transactions on  (Volume:32 ,  Issue: 5 )

Date of Publication: Sep 1996

Page(s):
4124 - 4129
ISSN :
0018-9464
INSPEC Accession Number:
5414735
Digital Object Identifier :
10.1109/20.539316
Product Type:
Journals & Magazines
Date of Current Version :
06 August 2002
Issue Date :
Sep 1996
Sponsored by :
IEEE Magnetics Society

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