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A technique of numerical treatment of magnetic force microscopy (MFM) data matrices has been exploited to enhance the quality of raw MFM images of patterned Co thin films obtained by electron beam lithography on RF sputtered 30-nm-thick Co samples. The pattern consists of chains of elliptical cylinders whose major axis is around 2.5 Â¿ m and whose minor axis is around 0.5 Â¿m (aspect ratio 5:1). In this work, a new differential approach is proposed. Two or more MFM images of the same surface area of a soft ferromagnetic material submitted to different magnetic fields H are examined, and the different arrangements of the local magnetization, as emerging from contrast differences in MFM images, are analyzed as functions of H. It is shown that this differential approach is able to account for the effect of the MFM tip on the magnetization of the investigated soft magnetic material. The patterned Co samples used to demonstrate this method have been demagnetized before each MFM scan in the plane of the film by applying an alternate field of progressively small absolute value.RF sputtered samples.