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Transient Analysis and Device Characterization of ACP Circuits

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4 Author(s)

Characterization of devices for high speed ACP (Advanced Circuit Program) circuits demands an accurate study of transients and switching delays. This paper describes (a) the large-signal transistor model evolved for the purpose of carrying out such an analysis; (b) methods of measuring device parameters with relevant theory; (c) computational techniques most adaptable; and (d) correlation between predicted and observed transients. Many new ideas in the development of the device model, measurements, and computational procedure are reported and could be used for any general circuit analysis.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:7 ,  Issue: 3 )