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A technique for measuring partial erasure

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2 Author(s)
Nishida, N. ; Thin Films Lab., Mitsubishi Chem. Corp., Yokohama, Japan ; Yanoauchi, T.

A new technique for distinguishing partial erasure from nonlinear transition shift (NLTS) is presented for the case of a dibit. Experimental results obtained by using the method show that the partial erasure of a square wave is twice as large as that of a dibit. Calculation of NLTS using a first-order approximation is not correct at high recording densities

Published in:

Magnetics, IEEE Transactions on  (Volume:32 ,  Issue: 5 )

Date of Publication:

Sep 1996

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