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Low Energy Electron Diffraction (LEED) Spectra: Aluminum

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1 Author(s)
Jona, F. ; Department of Materials Science, State University of New York, Stony Brook, 11790, USA

The intensities of low energy electron beams specularly and nonspecularly diffracted from {100}, {110} and {111} surfaces of aluminum have been measured in a display-type LEED system as functions of electron energy, angle of incidence and azimuthal angle. Several of the measured and normalized spectra are presented, and the procedures followed in aligning the sample, reducing stray magnetic fields, and collecting and normalizing the data are described.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:14 ,  Issue: 4 )