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An Application of White Light Interferometry in Thin Film Measurements

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2 Author(s)
Lin, C. ; IBM Systems Development Division Laboratory, San Jose, California 95114, USA ; Sullivan, R.F.

An application of the white light interferometry technique has been developed for measuring the thickness of thin films. The technique is used in the development of sliders which serve as carriers for the magnetic transducers (read/write elements) that operate in close proximity to magnetic disks. With the proper design of a surface contour and the applied load on the slider, a self-acting air bearing is created under the slider due to the boundary layer existing on a rotating disk.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:16 ,  Issue: 3 )