Skip to Main Content
It is found that the structure of amorphous Gd-Co films, as revealed by x-ray diffraction, is correlated with the magnitude of bias voltage present during the sputter deposition. Films sputter deposited with zero bias voltage typically show one broad peak in an x-ray diffraction spectrum, and films sputter deposited with −100 volts bias show two broad peaks with a shoulder between them. These structural differences appear to be related to the perpendicular magnetic anisotropy in these films.
Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.