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Properties of Polymeric Thin Films by Integrated Optical Techniques

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4 Author(s)
Swalen, J.D. ; IBM Research Division laboratory, 5600 Cottle Road, San Jose, California 95193, USA ; Santo, R. ; Tacke, M. ; Fischer, J.

We report an innovative procedure for taking measurements using integrated optical techniques on a number of polymers fabricated into thin film form and used as optical waveguides. Refractive index (including anisotropy), absorption and scattering, and film thickness have been determined by light guiding properties. Techniques for film preparation, including doctor blading, dipping, horizontal flowing, and spinning, are also discussed. The polymers studied are poly(methyl methacrylate), poly(vinyl-formal), poly-acrylonitrile, poly(vinyl alcohol), poly(vinyl pyrrolidone), poly(vinyl benzoate), and polystyrene.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:21 ,  Issue: 2 )

Date of Publication:

March 1977

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