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Development of Interconnection Technology for Large-Scale Integrated Circuits

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3 Author(s)
Babuka, R. ; IBM General Technology Division laboratory. P.O. Box 6, Endicott, New York 13760, USA ; Saxenmeyer, G.J. ; Schultz, L.K.

The size, cost, reliability, and serviceability of modern large data processing systems are influenced by the electrical interconnections required among the hundreds or thousands of chips they contain. The development of the complex interconnection design scheme is profoundly influenced by the interactions among the component and subassembly designs: modules, printed-circuit boards, cables, connectors, etc. The design scheme is also strongly affected by the constraints imposed by manufacturing process limitations and by environmental factors, such as cooling and corrosion. This paper deals with these interactions and constraints as encountered in the interconnection design of the IBM 3081 system and the design discipline required to deal with them.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:26 ,  Issue: 3 )

Date of Publication:

May 1982

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