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Semiconductor Final Test Logistics and Product Dispositioning Systems

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3 Author(s)
Burgess, Robert M. ; IBM General Technology Division, East Fishkill facility, Hopewell Junction, New York 1253, USA ; Koens, Kathleen B. ; Pignetti, Emil M.

As product lines at the IBM East Fishkill plant have expanded in the last few years, and as the number of technologies and semiconductor wafer and module volumes have increased, more sophisticated software systems were introduced which not only drove test times downward, but also reduced the development time previously required to accommodate testing new technologies. This paper discusses two such systems developed for the bipolar semiconductor line. They are a final test logistics system which provides for computerized tracking of each device in the production line through both testing and diagnostic analysis, and an automatic product dispositioning system which immediately identifies shippable product batches after flow through the test sector or schedules the batches for additional diagnostic analysis.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:26 ,  Issue: 5 )