By Topic

Polymer Structure Determination Using Electron Diffraction Techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Geiss, R.H. ; IBM Research Division, 5600 Cottle Road, San Jose, California 95193, USA ; Street, G.B. ; Volksen, W. ; Economy, J.

The crystallographic structure of organic crystals is most commonly studied using x-ray diffraction (XRD) techniques. Unfortunately, rather large crystals, at least 106 µm3, are required for XRD analysis, and it is often quite difficult and sometimes impossible to prepare such large crystals. On the other hand, electron diffraction techniques, although not nearly as precise as XRD, do afford the capability of studying much smaller crystals. The minimum size for electron diffraction is on the order of 10−3 µm3 (0.1 µm2 area by 0.01 µm thick). Since most polymer crystals are very sensitive to radiation damage caused by the beam in the electron microscope, special precautions must be taken to minimize beam damage to the specimen. Our approach to minimizing radiation damage, while still obtaining usable diffraction data, is described in terms of using the condenser-objective lens optics of the Philips 301 S(TEM) electron microscope. Three examples of the application of electron diffraction structure analysis are given. These include the structures of halogenated polysulfur nitride (SN)x, neutral α,α'-polypyrrole, and poly(p-hydroxybenzoic acid) (PHBA).

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:27 ,  Issue: 4 )