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A CMOS LSSD test generation system

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3 Author(s)
D. Leet ; IBM General Technology Division, Burlington facility, P.O. Box A, Essex Junction, Vermont 05452, USA ; P. Shearon ; R. France

Automatic test pattern generators based on the stuck-fault concept are theoretically inadequate in their ability to generate test patterns for CMOS circuits. A new set of pin faults, called CMOS faults, is discussed that can represent the necessary test pattern sequences for these circuits. Processing of these faults by a new test pattern generator, called the Enhanced Test Generator (ETG), is also described.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:28 ,  Issue: 5 )