Skip to Main Content
In previous treatments of the manufacturing yield of fault-tolerant integrated-circuit chips, fault clusters were either assumed to be absent or relatively large in area. Presented here is a treatment in which the occurrence of small-area fault clusters is assumed. Four different types of statistical distributions are considered, and a criterion is described for determining whether small-area fault clusters are present.
Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.