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Self-testing the 16-Mbps adapter chip for the IBM token-ring local area network

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5 Author(s)
Oakland, S.E. ; IBM General Technology Division, Essex Junction, Vermont 05452, USA ; Corr, J.L. ; Blair, J.D. ; Norman, R.D.
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This paper describes the boundary-scan and built-in self-test (BIST) functions of the IBM token-ring local area network (LAN) adapter chip. These functions present a number of unique features. First, less that 1% of available standard cell circuits were needed to implement these functions. Second, clocking methods used in different logical macros were merged into a comprehensive clocking sequence for self-test. Finally, asynchronous serial and parallel interfaces were provided to facilitate the communication between a test system and the chip's built-in test circuits. Although self-test and boundary-scan provide for an inexpensive higher-level package test, evaluation showed that automatically generated deterministic patterns provide a better-quality VLSI chip manufacturing test.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:34 ,  Issue: 2.3 )