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Built-in self-test support in the IBM Engineering Design System

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2 Author(s)
Keller, B.L. ; IBM Data Systems Division, P.O. Box 8008, Endicott, New York 13760, USA ; Snethen, T.J.

To evaluate the effectiveness of built-in self-test (BIST) for logic circuits, the test design automation (TDA) group within the IBM Engineering Design System (EDS) has developed tools to support BIST. This paper is an overview of that support. The specific hardware approaches taken are described briefly, and a short description is given of the major tools that have been developed and the methodology for using them. The performance of the system is shown for two sample circuits.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:34 ,  Issue: 2.3 )