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The development of ultra-high-frequency VLSI device test systems

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2 Author(s)
Rodriguez, C.W. ; IBM General Technology Division, East Fishkill facility, Route 52, Hopewell Junction, New York 12533, USA ; Hoffman, D.E.

The development of test systems for high-performance semiconductor logic and memory devices is discussed. The capabilities of shared-resource and tester-per-pin system architectures are reviewed. Test-system hardware design to provide high-speed pin electronics and generation of LSSD, weighed random, and algorithmic patterns is described. The reasons for the selection of the tester-per-pin system architecture are given in terms of the way in which overall system accuracy and test-system user flexibility are maximized for differing test methodologies.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:34 ,  Issue: 2.3 )