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Picture processing and three-dimensional visualization of data from scanning tunneling and atomic force microscopy

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1 Author(s)
Stoll, E.P. ; IBM Research Division, Zurich Research Laboratory, 8803 Rüschlikon, Swirzerland

We present an overview of the current status of picture processing and three-dimensional visualization of data from scanning tunneling microscopy and related techniques. The topics we cover include the physical basis of the resolution limit and noise sources in scanning microscopes, the design and restoration filters, and methods of visualizing surface contours and other surface properties by use of shadowing, contour lines, and superimposed colors. Postprocessed images of gold, graphite, biological molecules, the active zone of a laser diode, and silicon illustrate the outstanding quality of these methods.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

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IBM Journal of Research and Development  (Volume:35 ,  Issue: 1.2 )