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Functional testing of TFT/LCD arrays

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4 Author(s)
Jenkins, L.C. ; IBM Research Division, Thomas J. Watson Research Center, P.O. Box 704, Yorktown Heights, New York 10598, USA ; Polastre, R.J. ; Troutman, R.R. ; Wisnieff, R.L.

The thin-film-transistor liquid crystal display (TFT/LCD) is emerging as the leading flat-panel display in computer applications. TFT array characterization is important to the research, development, and manufacturing of TFT/LCDs. This paper describes a new Dynamic Array Tester developed for that purpose and describes some examples of its use.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:36 ,  Issue: 1 )