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Atomic-scale metal adhesion investigated by scanning tunneling microscopy

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1 Author(s)
Durig, U. ; IBM Research Division, Zurich Research Laboratoy, Säurnerstrasse 4, 8803 Rüschlikon, Switzerland

The interaction of a sharply pointed metal tip with a metal surface is investigated both theoretically and experimentally. By resorting to an effective potential approach, the characteristics of tip-sample forces are analyzed systematically in terms of known theory of bulk metal adhesion. Experiments probing the short-range adhesion interaction by means of a combination of force gradient sensing with tunneling microscopy are described. It is found that the concepts based on adhesion at a macroscopic level are not generally applicable in describing the observed tip-sample force gradient characteristics. These characteristics can, however, be explained in a semiquantitative way using effective interactions determined from a cluster calculation. It is also shown that the chemical information obtained by probing short-range interactions can be used to identify adsorbates on metal surfaces.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:38 ,  Issue: 4 )