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CMOS circuits for Gb/s serial data communication

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6 Author(s)
Ewen, J.F. ; IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598, USA ; Soyuer, M. ; Widmer, A.X. ; Wrenner, K.R.
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The functional characteristics and design challenges associated with a variety of communication-related circuits are presented. These include the mixed-signal design and noise issues associated with high-speed clock generation and recovery for serial data communication. Hardware results are presented on the noise properties of common integrated voltage-controlled oscillator (VCO) circuits.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:39 ,  Issue: 1.2 )