Cart (Loading....) | Create Account
Close category search window
 

Some thoughts about scanning probe microscopy, micromechanics, and storage

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Pohl, D.W. ; IBM Research Division, Zurich Research Laboratory, CH-8803 Rüschlikon, Switzerland

Interaction and actuation mechanisms used in scanning probe microscopies (SPM) have inherent potential for storage applications, but many unresolved conceptual and technical questions have precluded a thorough assessment of this potential so far. However, the intrinsic properties of SPM instrumentation and tip/sample interactions allow a number of important parameters and their ultimate values to be estimated. Coping with and possibly surpassing established technologies will require massive parallelism of SPM-type recording heads, a condition that might be satisfied in an elegant manner by using SPM-type, circulating piezoelectric flexural actuators. Operation of an entire array of recording heads will require highly precise micromechanical manufacturing and/or sophisticated control mechanisms. The resulting tolerance requirement can be relaxed by choosing long-range SPM interactions (Coulomb forces, capacitance, near-field optics, etc.). Furthermore, the interaction must allow a high recording speed. The restriction to read-only storage can facilitate exploratory work; the writing process in this case might be replaced by replication, similar to the techniques used in the production of compact disks.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:39 ,  Issue: 6 )

Date of Publication:

Nov. 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.