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S/390 G5 CMOS microprocessor diagnostics

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5 Author(s)
Song, P. ; IBM System/390 Division, 522 South Road, Poughkeepsie, New York 12601, USA ; Motika, F. ; Knebel, D.R. ; Rizzolo, R.F.
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This paper describes the strategies and techniques used to diagnose failures in the IBM 600-MHz S/390® G5 (Generation 5) CMOS microprocessor and the associated cache chips. The complexity, density, cycle time, and technology issues related to the hardware, coupled with time-to-market requirements, have necessitated a quick diagnostic turnaround time. Beginning with the first prototype of the G5 microprocessor chip, intense chip diagnostics and physical failure analysis (PFA) have successfully identified the root causes of many failures, including process, design, and random manufacturing defects. In this paper, three different diagnostic techniques are described that have enabled the G5 to achieve its objective. An example is presented for each technique to demonstrate its effectiveness.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:43 ,  Issue: 5.6 )