Skip to Main Content
Functional simulation of direct-access storage devices allows for testing and experimenting with a current or new direct-access device without it being available or attached to the system. In particular, the MVE mode of DSIM allows the simulation of devices under any operating system. The techniques provided are data-driven, thus allowing the simulation of devices with differing characteristics. T he interactive options enable the user to create or check for errors and thus provide for testing of the various error routines associated with the device. This capability is not generally attainable even with the real device. By extending the measurement routines, other device performance statistics may also be obtained. DSIM does not impair the security of the data within the system on which it is being used since it will not access any existing data within the system. DSIM is useful as an experimental intervirtual machine communication mechanism.
Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.