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An AFM study of environmental contaminants and lubricant morphology on the magnetic hard-disk surface

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5 Author(s)
Chekanov, A.S. ; Magnetics Technol. Centre, Nat. Univ. of Singapore, Singapore ; Low, T.S. ; Alli, S. ; Agarwal, S.
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Atomic Force Microscopy (AFM) was used to study some common hard-disk drive environmental contaminants. Possibility of application of AFM for the detection and characterization of the organic contaminants on the disk surface was demonstrated. Effects of contaminants on morphology of lubricant film are discussed

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Magnetics, IEEE Transactions on  (Volume:32 ,  Issue: 5 )