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Error analysis of a multiwavelength dynamic flying height tester

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1 Author(s)
C. A. Duran ; Phase Metrics, San Diego, CA, USA

We discuss several different sources of error which are relevant to flying height measurements done with the Phase Metrics dynamic flying height tester and with other commercial interferometric testers. It is argued that although the phase shift that takes place upon reflection on the slider material is indeed an important systematic correction, its role in the repeatibility, reproducibility and accuracy of the measurements is secondary when compared with calibration errors

Published in:

IEEE Transactions on Magnetics  (Volume:32 ,  Issue: 5 )