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A process-integrated approach to defect prevention

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1 Author(s)
Jones, C.L. ; IBM Communication Products Division, P.0. Box 12195, Research Triangle Park, North Carolina 27709, USA

Recent efforts to improve quality in software have concentrated on defect detection. This paper presents a programming process methodology for using causal analysis and feedback as a means for achieving quality improvements and ultimately defect prevention. The methodology emphasizes effective utilization of all error data to prevent the recurrence of defects.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Systems Journal  (Volume:24 ,  Issue: 2 )