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Using a constraint satisfaction formulation and solution techniques for random test program generation

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4 Author(s)
Bin, E. ; IBM Research Division, Haifa Research Laboratory, Haifa 31905, Israel ; Emek, R. ; Shurek, G. ; Ziv, A.

Automatic generation of test programs plays a major role in the verification of modern processors and hardware systems. In this paper, we formulate the generation of test programs as a constraint satisfaction problem and develop techniques for dealing with the challenges we face, most notably: huge variable domains (e.g., magnitude of 264) and the need to randomly generate “well distributed” samplings of the solution space. We describe several applications of our method, which include specific test generators targeted at various parts of a design or stages of the verification process.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Systems Journal  (Volume:41 ,  Issue: 3 )