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Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images

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2 Author(s)
Malik, A.S. ; Dept. of Electr. & Electron. Eng., Univ. Teknol. PETRONAS, Tronoh, Malaysia ; Tae-Sun Choi

Focus measures are an integral part for the passive 3D shape recovery methods. This paper presents an analysis of various well established focus measures with varying texture reflectance and source illumination. Five focus measures are selected from the literature. Three different microscopic objects are selected for testing the texture reflectance. Three different levels are opted for source illumination. Among the passive methods, shape from focus (SFF) is selected to test the focus measures for accuracy and precision of depth estimation.

Published in:

Computer and Electrical Engineering, 2009. ICCEE '09. Second International Conference on  (Volume:2 )

Date of Conference:

28-30 Dec. 2009