By Topic

Formation of 1-D Nanostructures Using Atomic Force Microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Hyungoo Lee ; Texas A&M University, College Station, TX, USA ; Rodrigo Cooper ; Murat Kaya Yapici ; Jun Zou
more authors

In this paper, we develop a new process using an atomic force microscope (AFM) to fabricate micro- and nanostructures. An AFM probe was coated with gold, and then, slid on a silicon substrate in ambient environment. Repetitive sliding of the probe generated a nanostructure on the substrate instead of plowing. The Au material was found to transfer from the probe onto the Si substrate. Morphological, electrical, and chemical properties were characterized using high-resolution techniques. It was found that the nanostructure was composed of an Au-Si alloy, which behaved like a conductor. The mechanisms of the process and effects of electrical potential are discussed in this paper.

Published in:

IEEE Transactions on Nanotechnology  (Volume:10 ,  Issue: 2 )