Cart (Loading....) | Create Account
Close category search window
 

Investigation of the Device Degradation Mechanism in Pentacene-Based Thin-Film Transistors Using Low-Frequency-Noise Spectroscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Ke, Lin ; Inst. of Mater. Res. & Eng., Agency for Sci., Technol. & Res., Singapore, Singapore ; Bin Dolmanan, S. ; Vijila, Chellappan ; Chua, Soo Jin
more authors

The degradation process in pentacene-based organic thin-film transistors (OTFTs) is investigated. Pentacene-based OTFTs were fabricated with and without octadecyl trichlorosilane (OTS) treatment, and their device characteristics during lifetime test are evaluated using low-frequency-noise (LFN) spectroscopy. It is found that the devices exhibited the 1/f type of noise behavior with generation and recombination noise superimposed. The drain-current noise was found to vary proportionally with drain current according to Hooge's empirical relation of flicker noise. Devices without any treatment show obvious interface traps and deep-level traps, while devices with OTS treatment show nonexistence of interface traps and suppression of deep-level traps. The LFN intensity is found to decrease during the device lifetime test initially, while upon the device failure, the noise level is observed to increase again. The viability of using LFN as a diagnostic tool in the organic transistor is demonstrated.

Published in:

Electron Devices, IEEE Transactions on  (Volume:57 ,  Issue: 2 )

Date of Publication:

Feb. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.