Close category search window
 

Surface Defect Characterization in Polishing Process Using Contour Dispersion

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Besari, A.R.A. ; Fac. of Manuf. Eng., Univ. Teknikal Malaysia Melaka (UTeM), Ayer Keroh, Malaysia ; Zamri, R. ; Rahman, K.A.A. ; Palil, D.M.
more authors

Automatic surface defect detection with vision systems can bring manufacturers a number of significant benefits, especially when used on-line. This non-contact method may present an alternative to allow the surface defect to be measured rapidly and with an acceptable accuracy. One of the most promising of the non-contact methods in terms of speed and accuracy is the computer vision technique. This paper basically defines a surface defect characterization using contour dispersion. The basic idea of this research is to find an optimal gray-level threshold value for separating objects of interest in an image from the background based on their gray-level distribution using contour dispersion level to find the characteristic of surface defect. Next, the research direction has been suggested to develop an automatic polishing robot system using vision sensor based on surface defect characterization.

Published in:
Soft Computing and Pattern Recognition, 2009. SOCPAR '09. International Conference of

Date of Conference: 4-7 Dec. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.