Cart (Loading....) | Create Account
Close category search window
 

Generalized linear models in software reliability: parametric and semi-parametric approaches

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
El Aroui, M.-A. ; Lab. de Modelisation et Calcul, IMAG, Grenoble, France ; Lavergne, C.

The penalized likelihood method is used for a new semi-parametric software reliability model. This new model is a nonparametric generalization of all parametric models where the failure intensity function depends only on the number of observed failures, viz. number-of-failures models (NF). Experimental results show that the semi-parametric model generally fits better and has better 1-step predictive quality than parametric NF. Using generalized linear models, this paper presents new parametric models (polynomial models) that have performances (deviance and predictive-qualities) approaching those of the semi-parametric model. Graphical and statistical techniques are used to choose the appropriate polynomial model for each data-set. The polynomial models are a very good compromise between the nonvalidity of the simple assumptions of classical NF, and the complexity of use and interpretation of the semi-parametric model. The latter represents a reference model that we approach by choosing adequate link and regression functions for the polynomial models

Published in:

Reliability, IEEE Transactions on  (Volume:45 ,  Issue: 3 )

Date of Publication:

Sep 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.