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A New Algorithm for Fabric Defect Detection Based on Image Distance Difference

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2 Author(s)
Jingmiao Zhang ; Comput. Center, Hebei Univ. of Econ. & Bus., Shijiazhuang, China ; Linru Li

This paper brings forward a new method of detection of fabric defect, namely image distance difference arithmetic. The system permit user to set appropriate control parameter of fabric defect defection based on the type of the fabric. It can detect more than 30 kinds of common defects, which has advantages of high identification correctness and fast inspection speed. Finally, using some image processing technology to score the grade of piece to satisfy the quality and elevate the finished product ratio.

Published in:

Intelligent Information Technology Application, 2009. IITA 2009. Third International Symposium on  (Volume:2 )

Date of Conference:

21-22 Nov. 2009