Cart (Loading....) | Create Account
Close category search window
 

Feature Subset Selection Based on Binary Particle Swarm Optimization and Overlap Information Entropy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Aiguo Li ; Sch. Comput. Sci. & Technol., Xi''an Univ. of Sci. & Technol., Xi''an, China ; Baonan Wang

In pattern recognition system, many irrelevant or redundant features will not only reduce the performance of classifier but also lead to the "dimension disaster", so it is important to select features. This thesis proposes a new method of feature subset selection, which is based on discrete binary version of particle swarm optimization (BPSO) and overlap information entropy (OIE). This method does not depend on classifier. The main idea is: at first, a group of particles are generated randomly. The OIE between attribute set and class attribute is used as BPSO algorithm's fitness function, its size denotes the correlation degree between selected attribute set and class attribute. Then, feature subset is optimized by BPSO. Finally, feature subset, which has the largest OIE with class attribute, is selected as the optimal feature subset. Experimental results on Bio_Train dataset of KDDCUP2004 confirm that this method can find the optimal feature subset effectively and its classification results are not worse than all features' classification results.

Published in:

Computational Intelligence and Software Engineering, 2009. CiSE 2009. International Conference on

Date of Conference:

11-13 Dec. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.