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Generation of digital elevation models by using SIR-C/X-SAR multifrequency two-pass interferometry: the Etna case study

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11 Author(s)
Lanari, R. ; Istituto di Ricerca per l''Elettromagnetismo, IRECE-CNR, Naples, Italy ; Fornaro, G. ; Riccio, Daniele ; Migliaccio, M.
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The authors exploit the interferometric multifrequency potentiality of the SIR-C/X-SAR system which is equipped with an L-, C-, and X-band sensor. They present a solution to improve the unwrapping performance of the C- and X-band data by considering the L-band unwrapped pattern. A new algorithm for the generation of a single digital elevation model (DEM) combining L-, C-, and X-band information is presented. This solution is based on the fusion of the unwrapped phase patterns by using a Kalman filter. The proposed fusion operation also accounts for the coherence characteristics of the three data sets. The selected test site is the Mt. Etna region in Italy which is very interesting from the volcanological and geological point of view. Numerical assessments of the achieved results are provided by evaluating the height accuracy with respect to a reference DEM

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:34 ,  Issue: 5 )

Date of Publication:

Sep 1996

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