By Topic

A Method of Test Case Automatic Generation for Embedded Software

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yongfeng Yin ; Dept. of Syst. Eng. of Eng. Technol., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China ; Bin Liu

At present, embedded software testing automation is a hot topic and the test case automatic generation is one of the key problems. In this paper, UML and scenario technology are introduced into embedded software testing field. Based on the formal definition and testing coverage criteria of testing scenario, the description method of testing scenario based on UML activity diagram is studied firstly. And then, the generation algorithm of testing scenario and test case are put forward and the problem of test case automatic generation for embedded software is solved. With the successful application of the method in actual avionics embedded software testing, the correctness and effectiveness of the method are validated.

Published in:

Information Engineering and Computer Science, 2009. ICIECS 2009. International Conference on

Date of Conference:

19-20 Dec. 2009