Close category search window
 

Modelling Location-Aware Access Control Constraints for Mobile Workflows with UML Activity Diagrams

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Decker, M. ; Inst. AIFB, Univ. of Karlsruhe (TH), Karlsruhe, Germany

In this paper an extension to activity diagrams from the unified modeling language (UML) is proposed that supports the definition of several kinds of location constraints. A location constraint is a statement that says whether it is allowed to perform an activity within a mobile workflow at a particular location or not. They therefore constitute a special case of access control that is location-aware. We cover location constraints that are assigned at the design time of the workflow schema as well as constraints that a derived during the runtime of a workflow instance. Location constraints can help to tackle mobile-specific challenges that come along with the employment of mobile workflow systems, namely security issues and usability problems.

Published in:
Mobile Ubiquitous Computing, Systems, Services and Technologies, 2009. UBICOMM '09. Third International Conference on

Date of Conference: 11-16 Oct. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.