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Capacitance measurements and tree length estimation during electrical treeing in sub-picofarad samples

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5 Author(s)
Sonerud, B. ; Dept. of Mater. & Manuf. Technol., Chalmers Univ. of Technol., Goteborg, Sweden ; Bengtsson, T. ; Blennow, J. ; Gubanski, S.M.
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A method for measuring capacitance below 1 pF is presented, which is used to measure dielectric properties during electrical treeing in XLPE samples. The measured capacitance is compared with finite element computations and from these simulations a simple relationship between the capacitance increase and the tree length can be established which corresponds well to the tree length observed by optical microscopy.

Published in:

Dielectrics and Electrical Insulation, IEEE Transactions on  (Volume:16 ,  Issue: 6 )

Date of Publication:

December 2009

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