By Topic

Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A/D Converter INL Testing With a Low-Quality Sine Wave Stimulus

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Korhonen, E. ; Dept. of Electr. & Inf. Eng., Univ. of Oulu, Oulu, Finland ; Wegener, C. ; Kostamovaara, J.

This paper proposes combining the standard histogram method with a stimulus identification algorithm in order to test the integral nonlinearity (INL) of a high-resolution analog-to-digital (A/D) converter without a high-quality sine wave. The major problems in the two techniques are explained in order to appreciate the benefits of the combination. The increased INL estimation accuracy is verified with simulations of 16-b A/D converters under different conditions, and experimental results of the INL testing of a 16-b A/D converter are also quoted to support the theory. The simulations and experimental tests show that the INL of 16-b A/D converters can be measured with very simple equipment and that an accurate test stimulus is not necessary.

Published in:

Circuits and Systems I: Regular Papers, IEEE Transactions on  (Volume:57 ,  Issue: 6 )