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Measurement of material shielding effectiveness using a dual TEM cell and vector network analyzer

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1 Author(s)
Manara, A. ; Centro Elettrotecnico Sperimentale Italiano, Milan, Italy

This paper deals with material shielding effectiveness (SE) measurements made with a system based on a vector network analyzer (VNA) and a dual TEM cell (DTEM). This system allows the separate measurement of the electric and magnetic SE (within the system dynamic range). A description of the measurement system is given together with a summary of the theory used. The limitations of the measuring system are also analyzed and discussed presenting some sample measurements

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Electromagnetic Compatibility, IEEE Transactions on  (Volume:38 ,  Issue: 3 )