Close category search window
 

Two Heads Better Than One: Metric+Active Learning and its Applications for IT Service Classification

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Fei Wang ; Sch. of Comput. & Inf. Sci., Florida Int. Univ., Miami, FL, USA ; Jimeng Sun ; Tao Li ; Anerousis, N.

Large IT service providers track service requests and their execution through problem/change tickets. It is important to classify the tickets based on the problem/change description in order to understand service quality and to optimize service processes. However, two challenges exist in solving this classification problem: 1) ticket descriptions from different classes are of highly diverse characteristics, which invalidates most standard distance metrics; 2) it is very expensive to obtain high-quality labeled data. To address these challenges, we develop two seemingly independent methods 1) discriminative neighborhood metric learning (DNML) and 2) active learning with median selection (ALMS), both of which are, however, based on the same core technique: iterated representative selection. A case study on real IT service classification application is presented to demonstrate the effectiveness and efficiency of our proposed methods.

Published in:
Data Mining, 2009. ICDM '09. Ninth IEEE International Conference on

Date of Conference: 6-9 Dec. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.