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Multi-tone Testing of Linear and Nonlinear Analog Circuits Using Polynomial Coefficients

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3 Author(s)
Sindia, S. ; Centre for Electron. Design & Technol., Indian Inst. of Sci., Bangalore, India ; Singh, V. ; Agrawal, V.D.

A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the applied input voltage at relevant frequencies in addition to DC. Classification of CUT is based on a comparison of the estimated polynomial coefficients with those of the fault free circuit. This testing method requires no design for test hardware as might be added to the circuit by some other methods. The proposed method is illustrated for a benchmark elliptic filter. It is shown to uncover several parametric faults causing deviations as small as 5% from the nominal values.

Published in:

Asian Test Symposium, 2009. ATS '09.

Date of Conference:

23-26 Nov. 2009