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Media Corrosion: Not Just an Overcoat Problem

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5 Author(s)
Dai, Q. ; San Jose Res. Center, Hitachi Global Storage Technol. Inc., San Jose, CA, USA ; Marchon, B. ; Do, H. ; Takano, K.
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This paper demonstrates that electrochemical impedance spectroscopy combined with atomic force microscopy analysis can successfully characterize the coverage ability of an overcoat on perpendicular magnetic recording media. Rougher media, brought about by lower surface energy oxide segregants, can adversely impact the overcoat integrity. The role of the capping layer, and its ability to somewhat planarize the overall structure, is also discussed.

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Magnetics, IEEE Transactions on  (Volume:46 ,  Issue: 1 )