Cart (Loading....) | Create Account
Close category search window
 

Sizing of multiple cracks using magnetic flux leakage measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Ravan, M. ; Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada ; Amineh, R.K. ; Koziel, S. ; Nikolova, N.K.
more authors

This study presents an approach to estimate the characteristics of multiple narrow-opening cracks from magnetic flux leakage (MFL) signals. The number, locations, orientations and lengths of the cracks are the objective of the inversion process. The proposed procedure provides a reliable estimation of crack parameters in two separate consecutive steps. In the first step, the Canny edge detection algorithm is used to estimate the number, locations, orientations and lengths of the cracks. Then, an inversion procedure based on space mapping is used in order to estimate the crack depths efficiently. The accuracy of the proposed algorithm is examined via simulations based on the finite element method as well as real experimental MFL data.

Published in:

Science, Measurement & Technology, IET  (Volume:4 ,  Issue: 1 )

Date of Publication:

January 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.