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The execution of this research is to investigate the effects of integrating photodiode onto 0.5 Â¿m and 0.35 Â¿m CMOS process technology. The research was carried out by using SILVACO software tool. The device performance and electrical properties are observed and analyzed. It can be conclude that the integration of photodiode onto CMOS technology resulted detrimental effect to the electrical characteristic of the device. However, the negative effect can be resolved by optimizing the threshold voltage adjust implantation module. On the contrary, the existence of photodiode resulted in a constructive manner for the breakdown voltage of NMOS technology.