Cart (Loading....) | Create Account
Close category search window
 

Moment method solution of the EFIE for TE-wave scattering by conducting cylinders using basis and testing functions lacking in sufficient degrees of differentiability

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Xu, Yun-Sheng ; Dept. of Electron. Eng. & Inf. Sci., Univ. of Sci. & Technol. of China Hefei, Hefei, China ; Wang, Kan

The application of the method of moments usually requires a minimum degree of differentiability for basis and testing functions. Through the solution of the electric field integral equation (EFIE) for scattering by a perfect conducting cylinder illuminated by a TE wave, however, it is shown that such a restriction can be loosed. Theoretically, pulse basis functions and point matching are usually considered to be not suitable for the solution of the TE EFIE for lack of sufficient degrees of differentiability. Nevertheless proper treatment still permits their application. The basic idea is to avoid or eliminate all the nonphysical terms in the discretized equations produced by point matching. Several methods to tackle this problem are theoretically investigated and validated through numerical results for cylinders of various geometries.

Published in:

Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2009 3rd IEEE International Symposium on

Date of Conference:

27-29 Oct. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.