By Topic

Characterization and modeling of low frequency noise in single-walled carbon nanotube film-based devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ashkan Behnam ; Electrical and Computer Engineering, University of Florida, Gainesville, 32611, Florida ; Gijs Bosman ; Ant Ural

Summary form only given. Single-walled carbon nanotube (CNT) films are a new class of transparent, conductive, and flexible materials, and they exhibit uniform physical and electronic properties. Several promising device applications of CNT films have recently been demonstrated, such as thin film transistors, optoelectronic devices, and chemical sensors. For many of these applications, intrinsic noise level and its scaling with device parameters is undoubtedly one of the most important figures of merit; hence they are the focus of this study.

Published in:

2009 Device Research Conference

Date of Conference:

22-24 June 2009