Cart (Loading....) | Create Account
Close category search window
 

Terahertz pulsed spectroscopic imaging using optimized binary masks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

12 Author(s)
Shen, Y.C. ; Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool L69 3GJ, United Kingdom ; Gan, L. ; Stringer, M. ; Burnett, A.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3271030 

We report the development of a terahertz pulsed spectroscopic imaging system based on the concept of compressive sensing. A single-point terahertz detector, together with a set of 40 optimized two-dimensional binary masks, was used to measure the terahertz waveforms transmitted through a sample. Terahertz time- and frequency-domain images of the sample comprising 20×20 pixels were subsequently reconstructed. We demonstrate that both the spatial distribution and the spectral characteristics of a sample can be obtained by this means. Compared with conventional terahertz pulsed imaging, no raster scanning of the object is required, and ten times fewer terahertz spectra need be taken. It is therefore ideal for real-time imaging applications.

Published in:

Applied Physics Letters  (Volume:95 ,  Issue: 23 )

Date of Publication:

Dec 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.