Zirconium oxide (ZrO2) thin films with an average crystallite-size (L) ranging from 5 to 25 nm were grown by sputter deposition onto optical grade quartz substrates. The optical properties of grown ZrO2 films were evaluated using optical transmission and reflectance spectroscopic measurements. The size-effects were significant on the optical characteristics of ZrO2 films. The bandgap energy (Eg) was found to increase from 5.78 to 6.07 eV with decreasing L values from 20 to 7 nm. A direct, linear inverse L-Eg relationship found for ZrO2 films suggest that tuning optical properties for desired applications can be achieved by controlling the size.
Published in:
Applied Physics Letters
(Volume:95
,
Issue:
23
)
Date of Publication:
Dec 2009
- Page(s):
-
231905
-
231905-3
- ISSN :
-
0003-6951
- Digital Object Identifier :
-
10.1063/1.3271697
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
15 December 2009
- Issue Date :
-
Dec 2009